Point Defects in Semiconductors and Insulators: Determination of Atomic and Electronic Structure from Paramagnetic Hyperfine Interactions
This Book Introduces The Principles And Techniques Of Modern Electron Paramagnetic Resonance (EPR) Spectroscopy That Are Essential For Applications Used To Determine Microscopic Defect Structures. Many Different Magnetic Resonance Methods Are Required For Investigating The Microscopic And Electronic, Download PDF file of Point Defects in Semiconductors and Insulators: Determination of Atomic and Electronic Structure from Paramagnetic Hyperfine Interactions, Published originally in 2003. This PDF file has 496 Pages pages and the PDF file size is 16.72 MB. The PDF file is written in English, Categorized in . As of 11 February 2025, this page has been bookmarked by 30,018 people. Now You Can Download "Point Defects in Semiconductors and Insulators: Determination of Atomic and Electronic Structure from Paramagnetic Hyperfine Interactions Book" as PDF or You Can See Preview By Clicking Below Button.
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